Simulated study on breakdown process in lower-pressure air based on PIC-MCC method

Summary

The understanding of breakdown process across lower-pressure air is essential for further miniaturization of electrical apparatus, considering the mean free path of electrons. In this study, the breakdown process in low-pressure air was simulated by plasma simulation based on PIC-MCC method. The most important factor on breakdown process in lower-pressure air, shown in this study, is the positive feedback of field emission current caused by positive space charges in vicinity of cathode electrode surface. Harmful condition is shown based on the amplification of field intensity.

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Keywords

NSDD, Microdischarge, VCB, Micro devices, PIC-MCC simulation