Summary

The guidelines to perform risk assessment on defects in GIS based on PD diagnostics are described in the brochure with reference to information available in the literature from laboratory, on-site and in-service measurements. The dielectric failure probability is calculated from a sensitive PD measurement and indicating type of defect and its location inside the GIS. The risk assessment is performed on the estimated dielectric failure probability and failure consequences. Examples of risk assessment are also provided.

Additional informations

Publication type Technical Brochures
Reference 525
Publication year 2013
Publisher CIGRE
Study committees Materials and emerging test techniques (D1)
Working groups WG D1.03
File size 1 MB
Pages number 52
Price for non member 110 €
Price for member Free
Risk Assessment on Defects in GIS based on PD Diagnostics
Risk Assessment on Defects in GIS based on PD Diagnostics